Dynamic Temperature IC Test Handler

Aetrium, Inc.odel DTX Series Dynamic Temperature IC Test Handler features dynamic conductive temperature control for high volume production IC test handling applications. The series can be configured in single or multiple test sites ranging up to 64 sites.

The series uses conductive thermal technology to monitor and control the temperature of each IC under test. The new design will allow the user to test devices dissipating up to 100 watts/cm² while maintaining the device under test (DUT) temperature set point within +2°C at the test site. ICs can be tested across a full range of temperature requirements in one pass, without having to take the IC out of the test socket. The device is suitable for high power IC testing applications and new forms of memory ICs, such as Direct Rambus DRAM.

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